Fine mapping and marker development for the wheat leaf rust resistance gene <i>Lr32</i>

Jyoti Saini Sharma; Curt A McCartney; Brent D McCallum; Colin W Hiebert

doi:10.1093/g3journal/jkac274

G3: Genes, Genomes, Genetics (Oct 2022)

Fine mapping and marker development for the wheat leaf rust resistance gene <i>Lr32</i>

Jyoti Saini Sharma,
Curt A McCartney,
Brent D McCallum,
Colin W Hiebert

Affiliations

Jyoti Saini Sharma: ORCiD; Agriculture and Agri-Food Canada, Morden Research and Development Centre, Morden, MB R6M 1Y5, Canada
Curt A McCartney: ORCiD; Department of Plant Sciences, University of Manitoba, Winnipeg, MB R3T 2N2, Canada
Brent D McCallum: ORCiD; Agriculture and Agri-Food Canada, Morden Research and Development Centre, Morden, MB R6M 1Y5, Canada
Colin W Hiebert: ORCiD; Agriculture and Agri-Food Canada, Morden Research and Development Centre, Morden, MB R6M 1Y5, Canada

DOI: https://doi.org/10.1093/g3journal/jkac274
Journal volume & issue: Vol. 13, no. 2

Abstract

Read online

AbstractWheat leaf rust is caused by the fungal pathogen Puccinia triticinaLr32Aegilops tauschiiLr32Lr322A. tauschiiLr32Kwh142Kwh355Lr32Kwh147Kwh722Lr32Lr67Lr34

Published in G3: Genes, Genomes, Genetics

ISSN: 2160-1836 (Online)
Publisher: Oxford University Press
Country of publisher: United Kingdom
LCC subjects: Science: Biology (General): Genetics
Website: https://academic.oup.com/g3journal

About the journal