ON THE TECHNIQUE OF THE EVALUATION OF THICKNESS DEPENDENCES OF REFRACTIVE INDEX FOR NANOSIZED LIQUID FILMS BY ELLIPSOMETRIC METHOD

Abstract

On the basis of the spectrum analysis of ellipsometric angles ψ and Δ, the technique of the evaluation of the thickness dependence of the refractive index for nanosized liquid films is outlined using the photometric spectroellipsometry.

Keywords

• photometric spectroellipsometer
• nanosized liquid films
• refractive index
• thickness dependence