Thermal Characterization of Low-Dimensional Materials by Resistance Thermometers
Yifeng Fu,
Guofeng Cui,
Kjell Jeppson
Affiliations
Yifeng Fu
Electronics Materials and Systems Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden
Guofeng Cui
Key Laboratory for Polymeric Composite & Functional Materials of Ministry of Education, The Key Lab of Low-Carbon Chemistry and Energy Conservation of Guangdong Province, Materials Science Institute, School of Chemistry, Sun Yat-sen University, Guangzhou 510275, China
Kjell Jeppson
Electronics Materials and Systems Laboratory, Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden
The design, fabrication, and use of a hotspot-producing and temperature-sensing resistance thermometer for evaluating the thermal properties of low-dimensional materials are described in this paper. The materials that are characterized include one-dimensional (1D) carbon nanotubes, and two-dimensional (2D) graphene and boron nitride films. The excellent thermal performance of these materials shows great potential for cooling electronic devices and systems such as in three-dimensional (3D) integrated chip-stacks, power amplifiers, and light-emitting diodes. The thermometers are designed to be serpentine-shaped platinum resistors serving both as hotspots and temperature sensors. By using these thermometers, the thermal performance of the abovementioned emerging low-dimensional materials was evaluated with high accuracy.
