Advances in Structural and Morphological Characterization of Thin Magnetic Films: A Review

Abstract

The present review places emphasis on a comprehensive survey of experimental techniques to probe the structural and morphological features at the nanoscale range in thin magnetic films, incorporating those available at in-house laboratories as well as those at state-of-the-art synchrotron radiation facilities. This elucidating the range of available techniques, and the information they can yield represents a step for advancing the understanding of and for unlocking new possibilities in the design and optimization of thin magnetic films across a wide range of applications.

Keywords

• microscopy
• diffraction
• spectroscopy
• thin magnetic films
• atomic structure