Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Abstract

Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) were used to study the surface charge densities, surface potentials, electric field intensities, and electric field force gradients of three common clay minerals: kaolinite, montmorillonite, and illite. The properties were directly imaged, and the average surface permanent charge densities of kaolinite, montmorillonite, and illite were obtained to be −0.0060, −2.136, and −5.456 μ C m ^−2 , respectively. In addition, a good linear relationship was found between the surface charge densities obtained by KPFM and the layer charges calculated from the mineral chemical formulas of three clay minerals.

Keywords

• electrostatic force microscopy
• kelvin probe microscopy
• kaolinite
• montmorillonite
• illite
• surface electrical properties