Journal of Materials Research and Technology (May 2024)

In situ measurement of three-dimensional intergranular stress localizations and grain yielding under elastoplastic axial-torsional loading

  • Yaozhong Zhang,
  • Mohammadreza Yaghoobi,
  • Yueheng Zhang,
  • Daniel Rubio-Ejchel,
  • Peter Kenesei,
  • Jun-Sang Park,
  • Anthony D. Rollett,
  • Jerard V. Gordon

Journal volume & issue
Vol. 30
pp. 8792 – 8804

Abstract

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The three-dimensional grain-averaged response of solid bar samples under non-proportional (NP) elastoplastic axial-torsional loading was investigated using in situ high energy diffraction microscopy (HEDM) and companion crystal plasticity finite element (CPFE) modeling. Important stress metrics including applied shear (σθZ) and axial (σZZ) stress tensor components, stress and stress deviator tensor invariants (I1, J2, and J3), von Mises equivalent stress (σVMgrain), maximum resolved shear stress (mRSS), stress triaxiality (η), and lode angle parameter (θ‾) values were tracked for ∼ 300 grains under two different loading conditions: (1) Torsion-dominated loading (low NP) and (2) Tension-torsion loading (high NP) in equiatomic NiCoCr, a representative multicomponent face-centered cubic (FCC) superalloy. Overall, significant stress localizations existed within both samples as evidenced by the radial dependence of grain-resolved σθZ, σVMgrain , and J2; by comparison, I1, J3, η, and θ‾ metrics did not show discernible trends within the volume. These stress localizations reveal a complex interplay between axial and shear stress components (e.g., stress coupling) resulting in grain yielding near the sample surface largely driven by shear stress, whereas internal grain yielding was largely accommodated by axial stress. Grain-resolved stress localization trends were described well by the CPFE model, although some discrepancies in magnitude occurred, particularly for volumetric stress metrics (I1 and η) due to initial type II residual stress distributions. The superposition of initial residual stress states onto CPFE grain-resolved data significantly improved model accuracy for η. This suggests that residual stresses more strongly influence the simulation of volumetric rather than deviatoric (yield) stress metrics.

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