EPJ Photovoltaics (Jan 2022)

Stable reverse bias or integrated bypass diode in HIP‑MWT+ solar cells

  • Schweigstill Tadeo,
  • Spribille Alma,
  • Huyeng Jonas D.,
  • Clement Florian,
  • Glunz Stefan W.

DOI
https://doi.org/10.1051/epjpv/2021016
Journal volume & issue
Vol. 13
p. 5

Abstract

Read online

The Metal Wrap Through+ (HIP-MWT+) solar cell is based on the PERC concept but features two additional electrical contacts, namely the Schottky contact between p-type Si bulk and Ag n-contact and the metal-insulator-semiconductor (MIS) contact on the rear side of the cell below the n-contact pads. To prevent thermal hotspots under reverse bias, both contacts shall either restrict current flow or allow a homogenous current flow at low voltage. In this work we present both options. First the stable reverse bias characteristics up to −15 V with a MIS contact using industrially manufactured SiON passivation and second, an integrated by-pass diode using AlOX as insulator in the passivation stack allowing current flows at approximately Vrev = –3.5 V depending on the chosen screen-print paste. The examined Schottky contacts break down at around Vrev = –2.5 V. Reverse bias testing of the cells reveals a solid performance of the cells under reverse bias and an average conversion efficiency of η = 21.2% (AlOX) and η = 20.7% (SiON), respectively.

Keywords