Crop Journal (Oct 2020)
Genome-wide association mapping for grain shape and color traits in Ethiopian durum wheat (Triticum turgidum ssp. durum)
Abstract
Grain shape and color strongly influence yield and quality of durum wheat. Identifying QTL for these traits is essential for transferring favorable alleles based on selection strategies and breeding objectives. In the present study, 192 Ethiopian durum wheat accessions comprising 167 landraces and 25 cultivars were genotyped with a high-density Illumina iSelect 90K single-nucleotide polymorphism (SNP) wheat array to conduct a genome-wide association analysis for grain width (GW), grain length (GL), CIE (Commission Internationale l'Eclairage) L* (brightness), CIE a* (redness), and CIE b* (yellowness) traits. The accessions were planted at Sinana Agricultural Research Center, Ethiopia in the 2015/2016 cropping season in a complete randomized block design with three replications. Twenty homogeneous and healthy seeds per replicate were used for trait measurement. Digital image analysis of seeds with GrainScan software package was used to generate the phenotypic data. Analysis of variance revealed highly significant differences between accessions for all traits. A total of 46 quantitative trait loci (QTL) were identified for all traits across all chromosomes. One novel major candidate QTL (−lg P ≥ 4) with pleiotropic effects for grain CIE L* (brightness) and CIE a* (redness) was identified on the long arm of chromosome 2A. Eighteen nominal QTL (−lg P ≥ 3) and 26 suggestive QTL (−lg P ≥ 2.5) were identified. Pleiotropic QTL influencing both grain shape and color were identified.