AIP Advances (Jul 2018)

Strain of M-plane GaN epitaxial layer grown on β-LiGaO2 (100) by plasma-assisted molecular beam epitaxy

  • Shuo-Ting You,
  • Ikai Lo,
  • Huei-Jyun Shih,
  • Hui-Chun Hang,
  • Mitch M. C. Chou

DOI
https://doi.org/10.1063/1.5037006
Journal volume & issue
Vol. 8, no. 7
pp. 075116 – 075116-8

Abstract

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We have grown a high-quality single-phase M-plane GaN on β-LiGaO2 (100) by plasma-assisted molecular beam epitaxy. The Hooke’s law for M-plane GaN was derived by a stress tenor transformation. From the analysis of M-plane GaN microstructure, the lattice strain of M-plane GaN along the [112¯0] and [0001] directions have been estimated. Based on the Hooke’s law, we calculated the ratio of anisotropic stress which was consistent with the ratio of thermal expansion-mismatch between GaN and LiGaO2 (100). We demonstrated that the thermal expansion mismatch was the major factor to degrade the quality of M-plane GaN on β-LiGaO2 (100).