Combined use of XP-Endo Finisher and different chelating agents on the smear layer

Abstract

Aim: The aim of this study was to assess the effect of XP-Endo Finisher (XPF) in conjunction with three different chelating agents, namely, 0.2% chitosan nanoparticles (CNP), 17% ethylenediaminetetraacetic acid (EDTA), and 7% maleic acid (MA) on residual debris and smear layer on the root canal walls of the mandibular premolars. Methods: Eighty extracted human mandibular premolars were used in the study. Canals were prepared using an XP-Endo Shaper, and the final finishing was done with an XPF file. Teeth were randomly divided into four experimental groups based on chelating agents, Group I (XPF + 0.2% CNP), Group II (XPF + 17% EDTA), Group III (XPF + MA), and Group IV XPF + 2.5% sodium hypochlorite (NaOCl) (control group). Teeth were longitudinally split and prepared for scanning electron microscopy analysis. For comparing the smear layer and debris score between groups, the Kruskal–Wallis ANOVA was used, followed by the post hoc Bonferroni test. The level of significance was set at P < 0.05. Results: Group I (XPF + 0.2% CNP) gave the best results (P = 0.001) in all the thirds of root canal, followed by Group II (XPF + 17% EDTA) with P = 0.001. Group III (XPF + MA) showed results similar to that of the control group (XPF + NaOCl) with P = 0.001. There was a significant difference in the scores between Group I (XPF + CNP) and the other three groups. Conclusion: In all three-thirds of a root canal, the use of XPF + 0.2% CNP performed best at removing the smear layer. This was followed by XPF + 17% EDTA and XPF + 7% MA. For all groups, smear layer removal was less efficient in the apical third.

Keywords

• ethylenediaminetetraacetic acid
• maleic acid
• nanochitosan
• scanning electron microscope
• smear layer
• xp-endo finisher