AIP Advances
(Aug 2024)
Hot spot localization in the field of view of the Kirkpatrick–Baez microscope
Yankang Wu,
Pin Yang,
Xing Zhang,
Jianjun Dong,
Jie Xu,
Mingtao Li,
Zhongjing Chen,
Yingjie Li,
Wei Jiang,
Chuankui Sun,
Liang Chen,
Wenjie Li,
Ji Yan,
Yudong Pu,
Yunsong Dong,
Dong Yang,
Feng Wang,
Baozhong Mu,
Zongqing Zhao
Affiliations
Yankang Wu
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Pin Yang
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Xing Zhang
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Jianjun Dong
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Jie Xu
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
Mingtao Li
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
Zhongjing Chen
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Yingjie Li
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Wei Jiang
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Chuankui Sun
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Liang Chen
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
Wenjie Li
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
Ji Yan
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Yudong Pu
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Yunsong Dong
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Dong Yang
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Feng Wang
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
Baozhong Mu
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
Zongqing Zhao
National Key Laboratory of Plasma Physics, Laser Fusion Research Center, China Academy of Engineering Physics, Mianyang 621900, China
DOI
https://doi.org/10.1063/5.0219716
Journal volume & issue
Vol. 14,
no. 8
Abstract
Read online
The Kirkpatrick–Baez (KB) microscope is an effective instrument for x-ray imaging of hot spot. However, the non-uniform distribution of response efficiency in the field of view is a drawback of the KB microscope. A more accurate hot spot image requires the correction of the measured image by combining the hot spot position and the response efficiency distribution. Here, we describe a method to locate the position of the hot spot in the field of view during hot spot imaging with a KB microscope. The position of the hot spot in the field of view can be obtained by measuring the grazing incidence angle change during hot spot imaging. In the experiment of hot spot self-emission imaging with a four-channel KB microscope, the location of the hot spot with an accuracy of 15 μm was realized, and the intensity corrected hot spot image was obtained. This will solve the problem of the non-uniform distribution of the response efficiency of the KB microscope and enable quantitative measurement of hot spot radiation intensity.
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