Research Progress on Characterization of Graphene Structure by Raman Spectroscopy

Abstract

Graphene is a kind of two-dimensional atomic crystal with one atomic layer, which is the basic structure unit of other dimensions of graphite materials, such as zero dimensional fullerenes, one-dimensional carbon nanotubes and three-dimensional graphite. Graphene has a lot of unique electronic and mechanical properties, which have attracted high attention of many scientists in the field of chemistry, materials and other fields. Raman spectroscopy as a sensitive and convenient characterization method, has played a very important role in the study of graphene. Raman spectroscopy is an integral part of graphene research. The application of Raman spectroscopy in graphene characterization in recent years is reviewed in this paper. The characteristic peak of monolayer graphene was first intnduced. Then, through the analysis of the changes of D peak, G peak and 2D peak intensity, position and half peak width of Raman spectra, the number of graphene layers can be quickly and accurately characterized, as well as, the stacking orders, edge chirality and doping degree of graphene were defined. At the same time, the effects of substrate, doping, temperature and laser power on the intensity, position and half width of D peak, G peak and 2D peak of Raman spectra in the process of preparing graphene were also systematically analyzed.

Keywords

• graphene
• Raman spectroscopy
• layer effect
• stacking order
• edge chirality
• doping degree