Incorporating long-tail data in complex backgrounds for visual surface defect detection in PCBs

Abstract

Abstract High-quality printed circuit boards (PCBs) are essential components in modern electronic circuits. Nevertheless, most of the existing methods for PCB surface defect detection neglect the fact that PCB surface defects in complex backgrounds are prone to long-tailed data distributions, which in turn affects the effectiveness of defect detection. Additionally, most of the existing methods ignore the intra-scale features of defects and do not utilize auxiliary supervision strategies to improve the detection performance of the network. To tackle these issues, we propose a lightweight long-tailed data mining network (LLM-Net) for identifying PCB surface defects. Firstly, the proposed Efficient Feature Fusion Network (EFFNet) is applied to embed intra-scale feature associations and multi-scale features of defects into LLM-Net. Next, an auxiliary supervision method with a soft label assignment strategy is designed to help LLM-Net learn more accurate defect features. Finally, the issue of inadequate tail data detection is addressed by employing the devised Binary Cross-Entropy Loss Rank Mining method (BCE-LRM) to identify challenging samples. The performance of LLM-Net was evaluated on a homemade dataset of PCB surface soldering defects, and the results show that LLM-Net achieves the best accuracy of [email protected] for the evaluation metric of the COCO dataset, and it has a real-time inference speed of 188 frames per second (FPS).

Keywords

• PCB defect detection
• Object detection
• EFFNet
• Auxiliary supervision
• BCE-LRM