Advanced Real-time Evaluation and Data Quality Monitoring Model Integration with FPGAs for Tokamak High-performance Soft X-ray Diagnostic System

Abstract

Based on the publications regarding new or recent measurement systems for the tokamak plasma experiments, it can be found that the monitoring and quality validation of input signals for the computation stage is done in different, often simple, ways. In the paper is described the unique approach to implement the novel evaluation and data quality monitoring (EDQM) model for use in various measurement systems. The adaptation of the model is made for the GEM-based soft X-ray measurement system FPGA-based. The EDQM elements has been connected to the base firmware using PCI-E DMA real-time data streaming with minimal modification. As additional storage, on-board DDR3 memory has been used. Description of implemented elements is provided, along with designed data processing tools and advanced simulation environment based on Questa software.

Keywords

• data quality monitoring
• system modeling
• fpga
• verilog/vhdl
• hdl
• gem detector
• sxr plasma diagnostics
• modular measurement system
• data evaluation