Counting on the future: fast charge-integrating detectors for X-ray nanoimaging

Abstract

A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.

Keywords

• coherent diffraction imaging
• fast charge-integrating detectors
• x-ray nanoimaging
• commentary