Beam profile measurement of ES-200 using secondary electron emission monitor

Iranian Journal of Physics Research. 2015;15(2):253-258

 

Journal Homepage

Journal Title: Iranian Journal of Physics Research

ISSN: 1682-6957 (Print); 2345-3664 (Online)

Publisher: Isfahan University of Technology

Society/Institution: Physics Society of Iran

LCC Subject Category: Science: Physics

Country of publisher: Iran, Islamic Republic of

Language of fulltext: Persian, English

Full-text formats available: PDF

 

AUTHORS

E Ebrahimi Basabi ( Department of Radiation Application, Shahid Beheshti University, G. C, Evin, Tehran )
A H Feghhi ( Department of Radiation Application, Shahid Beheshti University, G. C, Evin, Tehran )
M Nikhbakht ( Department of Radiation Application, Shahid Beheshti University, G. C, Evin, Tehran )
M Shafiee ( Department of Accelerator, Institute for Research in Fundamental Sciences, Tehran )

EDITORIAL INFORMATION

Peer review

Editorial Board

Instructions for authors

Time From Submission to Publication: 30 weeks

 

Abstract | Full Text

Up to now, different designs have been introduced for measurement beam profile accelerators. Secondary electron emission monitors (SEM) are one of these devices which have been used for this purpose. In this work, a SEM has been constructed to measure beam profile of ES-200 accelerator, a proton electrostatic accelerator which is installed at SBU. Profile grid for both planes designed with 16 wires which are insulated relative to each other. The particles with maximum energy of 200 keV and maximum current of 400 μA are stopped in copper wires. Each of the wires has an individual current-to-voltage amplifier. With a multiplexer, the analogue values are transported to an ADC. The ADCs are read out by a microcontroller and finally profile of beam shows by a user interface program