Security in defect detection: A new one-pixel attack for fooling DNNs

Abstract

The Industrial 5.0 Model integrates enabling technologies such as deep learning, digital twins, and the meta-universe with new development concepts. However, model and data security may pose challenges for developing zero-defect production and other industrial manufacturing industries. To address this issue, we generate adversarial examples using a one-pixel attack in adversarial machine learning, which can fool the defect detection classification model. The traditional one-pixel attack based on the Differential Evolution (DE) algorithm has limited global search ability. Therefore, we use a novel algorithm called Teaching and Learning-based Moth-Flame Optimization (TLMFO), which enhances the global search performance and improves the attack effectiveness. We evaluate TLMFO on benchmark functions and attacks on Cifar10 and ImageNet datasets, and compare it with MFO and DE. The results show that TLMFO outperforms both MFO and DE in terms of accuracy and speed of convergence. Moreover, TLMFO achieves notably better attack effectiveness than DE under targeted and untargeted attacks on the Cifar10 dataset and under-targeted attacks on the ImageNet dataset. Our research confirms that safety prevention is a link worth considering in developing Industry 5.0.

Keywords

• Industry 5.0
• Endogenous safety
• Zero-defect production
• Defect detection
• Network equipment
• Deep neural network