AIP Advances (May 2016)

High performance and transparent multilayer MoS2 transistors: Tuning Schottky barrier characteristics

  • Young Ki Hong,
  • Geonwook Yoo,
  • Junyeon Kwon,
  • Seongin Hong,
  • Won Geun Song,
  • Na Liu,
  • Inturu Omkaram,
  • Byungwook Yoo,
  • Sanghyun Ju,
  • Sunkook Kim,
  • Min Suk Oh

DOI
https://doi.org/10.1063/1.4953062
Journal volume & issue
Vol. 6, no. 5
pp. 055026 – 055026-6

Abstract

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Various strategies and mechanisms have been suggested for investigating a Schottky contact behavior in molybdenum disulfide (MoS2) thin-film transistor (TFT), which are still in much debate and controversy. As one of promising breakthrough for transparent electronics with a high device performance, we have realized MoS2 TFTs with source/drain electrodes consisting of transparent bi-layers of a conducting oxide over a thin film of low work function metal. Intercalation of a low work function metal layer, such as aluminum, between MoS2 and transparent source/drain electrodes makes it possible to optimize the Schottky contact characteristics, resulting in about 24-fold and 3 orders of magnitude enhancement of the field-effect mobility and on-off current ratio, respectively, as well as transmittance of 87.4 % in the visible wavelength range.