Nonlinear electrical properties of nanostructured porous silicon films

Abstract

Porous silicon films have been prepared by electrochemical etching. Morphology of the films has beenstudied by scanning probe microscope characterized by presence of self-similar structures with different scales from hundreds of nanometers to microns. Current-Voltage characteristic of nanofilms has several minima in contrast to the well-known effect of negative resistance in tunnel diodes. For theoretical description of the experimental results we suggest a new concept of "non-linear fractal".

Keywords

• porous silicon
• nanofilms
• negative resistance
• tunneling effect
• non-linear fractal.