Rapid Uniformity Analysis of Fully Printed SWCNT-Based Thin Film Transistor Arrays via Roll-to-Roll Gravure Process
Yunhyok Choi,
Younsu Jung,
Reem Song,
Jinhwa Park,
Sajjan Parajuli,
Sagar Shrestha,
Gyoujin Cho,
Byung-Sung Kim
Affiliations
Yunhyok Choi
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Younsu Jung
Department of Biophysics, Institute of Quantum Biophysics, Research Engineering Center for R2R-Printed Flexible Computer, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Reem Song
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Jinhwa Park
Department of Biophysics, Institute of Quantum Biophysics, Research Engineering Center for R2R-Printed Flexible Computer, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Sajjan Parajuli
Department of Intelligent Precision Healthcare Convergence, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Sagar Shrestha
Department of Intelligent Precision Healthcare Convergence, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Gyoujin Cho
Department of Biophysics, Institute of Quantum Biophysics, Research Engineering Center for R2R-Printed Flexible Computer, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
Byung-Sung Kim
Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University, Suwon-si 16419, Republic of Korea
The roll-to-roll (R2R) gravure process has the potential for manufacturing single-wall carbon nanotubes (SWCNT)-based thin film transistor (TFT) arrays on a flexible plastic substrate. A significant hurdle toward the commercialization of the R2R-printed SWCNT-TFT array is the lack of a suitable, simple, and rapid method for measuring the uniformity of printed products. We developed a probing instrument for characterizing R2R gravure printed TFT, named PICR2R-TFT, for rapidly characterizing R2R-printed SWCNT-TFT array that can present a geographical distribution profile to pinpoint the failed devices in an SWCNT-TFT array. Using the newly developed PICR2R-TFT instrument, the current–voltage characteristics of the fabricated SWCNT-TFT devices could be correlated to various R2R-printing process parameters, such as channel length, roll printing length, and printing speed. Thus, by introducing a characterization tool that is reliable and fast, one can quickly optimize the R2R gravure printing conditions to enhance product uniformity, thereby maximizing the yield of printed SWCNT-TFT arrays.
