Detection of surface defects and subsurface defects of polished optics with multisensor image fusion
Huanyu Sun,
Shiling Wang,
Xiaobo Hu,
Hongjie Liu,
Xiaoyan Zhou,
Jin Huang,
Xinglei Cheng,
Feng Sun,
Yubo Liu,
Dong Liu
Affiliations
Huanyu Sun
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Shiling Wang
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Xiaobo Hu
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Hongjie Liu
Research Center of Laser Fusion, China Academy of Engineering Physics
Xiaoyan Zhou
Research Center of Laser Fusion, China Academy of Engineering Physics
Jin Huang
Research Center of Laser Fusion, China Academy of Engineering Physics
Xinglei Cheng
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Feng Sun
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Yubo Liu
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Dong Liu
State Key Laboratory of Modern Optical Instrumentation, College of Optical Science and Engineering: International Research Center for Advanced Photonics, Zhejiang University
Abstract Surface defects (SDs) and subsurface defects (SSDs) are the key factors decreasing the laser damage threshold of optics. Due to the spatially stacked structure, accurately detecting and distinguishing them has become a major challenge. Herein a detection method for SDs and SSDs with multisensor image fusion is proposed. The optics is illuminated by a laser under dark field condition, and the defects are excited to generate scattering and fluorescence lights, which are received by two image sensors in a wide-field microscope. With the modified algorithms of image registration and feature-level fusion, different types of defects are identified and extracted from the scattering and fluorescence images. Experiments show that two imaging modes can be realized simultaneously by multisensor image fusion, and HF etching verifies that SDs and SSDs of polished optics can be accurately distinguished. This method provides a more targeted reference for the evaluation and control of the defects of optics, and exhibits potential in the application of material surface research.