Multilevel Resistive Switching Memory Based on a CH3NH3PbI 3−x Cl x Film with Potassium Chloride Additives

Abstract

Abstract High-quality CH3NH3PbI 3−x Cl x (MAPIC) films were prepared using potassium chloride (KCl) as an additive on indium tin oxide (ITO)-coated glass substrates using a simple one-step and low-temperature solution reaction. The Au/KCl-MAPIC/ITO/glass devices exhibited obvious multilevel resistive switching behavior, moderate endurance, and good retention performance. Electrical conduction analysis indicated that the resistive switching behavior of the KCl-doped MAPIC films was primarily attributed to the trap-controlled space-charge-limited current conduction that was caused by the iodine vacancies in the films. Moreover, the modulations of the barrier in the Au/KCl-MAPIC interface under bias voltages were thought to be responsible for the resistive switching in the carrier injection trapping/detrapping process.

Keywords

• Tri-state resistive switching behavior
• KCl-doped MAPIC films
• Iodine vacancies
• Trap-controlled SCLC conduction mechanism