Nature Communications (Jun 2020)

Closed-loop atomic force microscopy-infrared spectroscopic imaging for nanoscale molecular characterization

  • Seth Kenkel,
  • Shachi Mittal,
  • Rohit Bhargava

DOI
https://doi.org/10.1038/s41467-020-17043-5
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 10

Abstract

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Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.