Growth, magnetic, and electronic properties of Ni-Zn ferrites thin films

Abstract

Thin films of Ni-Zn ferrite grown on MgO(111) single crystal substrate were prepared using radiofrequency magnetron sputtering, with a target of nominal composition Ni _0.5 Zn _0.5 Fe _2 O _4 . Subsequently, x-ray diffraction (XRD) was performed, which revealed characteristic reflections of a Ni-Zn ferrite structure, confirming the unique formation of the ferrite. X-ray photoelectron spectroscopy (XPS) revealed the presence of metal ions in their appropriate valence states within the crystalline structure of the Ni-Zn ferrite. The variation in binding energy observed in the thin film is attributed to changes in the environment of Fe ^3+ and Zn ^2+ or Ni ^2+ ions, resulting from the non-equilibrium distribution of cations in tetrahedral and octahedral sites. The saturation magnetization and the coercivity field were $7.05{\mu }_{{\rm{B}}}/{\rm{cell}}$ and 513 ± 32 Oe, respectively. In addition, ferromagnetic resonance studies were made using broad-band FMR spectroscopy based on a coplanar waveguide (CPW) spectrometer.

Keywords

• Ni-Zn ferrite
• x-ray photoelectron spectroscopy
• ferromagnetic resonance