IEEE Access (Jan 2018)

Investigation of Terahertz 3D EM Simulation on Device Modeling and A New InP HBT Dispersive Inter-Electrode Impedance Extraction Method

  • Yapei Chen,
  • Yong Zhang,
  • Yuehang Xu,
  • Yan Sun,
  • Wei Cheng,
  • Haiyan Lu,
  • Fei Xiao,
  • Ruimin Xu

DOI
https://doi.org/10.1109/ACCESS.2018.2865929
Journal volume & issue
Vol. 6
pp. 45772 – 45781

Abstract

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In this paper, a new 3-D electromagnetic (EM) simulation approach for heterojunction bipolar transistor (HBT) parameter extraction in terahertz band is presented. We introduce an inter-electrode impedance equivalent-circuit model with the concept of dispersive parameters and a more rigorous 3-D EM simulation parameter extraction method to avoid serious discrepancies between the simulated EM field distribution and the real EM field distribution of the device. Terahertz parasitic effects, including the EM field discretization and multi-finger device field sharing, are observed. Compared with the previous 3-D EM simulation-assisted model, the new model in this paper demonstrates better results for multi-finger indium phosphide HBTs.

Keywords