Security–Reliability Analysis of AF Full-Duplex Relay Networks Using Self-Energy Recycling and Deep Neural Networks
Tan N. Nguyen,
Bui Vu Minh,
Dinh-Hieu Tran,
Thanh-Lanh Le,
Anh-Tu Le,
Quang-Sang Nguyen,
Byung Moo Lee
Affiliations
Tan N. Nguyen
Communication and Signal Processing Research Group, Faculty of Electrical and Electronics Engineering, Ton Duc Thang University, Ho Chi Minh City 70000, Vietnam
Bui Vu Minh
Faculty of Engineering and Technology, Nguyen Tat Thanh University, 300A-Nguyen Tat Thanh, Ward 13, District 4, Ho Chi Minh City 754000, Vietnam
Dinh-Hieu Tran
Department of Technology, Dong Nai Technology University, Bien Hoa 76000, Vietnam
Thanh-Lanh Le
Department of Technology, Dong Nai Technology University, Bien Hoa 76000, Vietnam
Anh-Tu Le
Faculty of Electrical Engineering and Computer Science, VSB-Technical University of Ostrava, 17. Listopadu 2172/15, 70800 Ostrava, Czech Republic
Quang-Sang Nguyen
Science and Technology Application for Sustainable Development Research Group, Ho Chi Minh City University of Transport, Ho Chi Minh City 70000, Vietnam
Byung Moo Lee
Department of Intelligent Mechatronics Engineering, and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea
This paper investigates the security–reliability of simultaneous wireless information and power transfer (SWIPT)-assisted amplify-and-forward (AF) full-duplex (FD) relay networks. In practice, an AF-FD relay harvests energy from the source (S) using the power-splitting (PS) protocol. We propose an analysis of the related reliability and security by deriving closed-form formulas for outage probability (OP) and intercept probability (IP). The next contribution of this research is an asymptotic analysis of OP and IP, which was generated to obtain more insight into important system parameters. We validate the analytical formulas and analyze the impact on the key system parameters using Monte Carlo simulations. Finally, we propose a deep learning network (DNN) with minimal computation complexity and great accuracy for OP and IP predictions. The effects of the system’s primary parameters on OP and IP are examined and described, along with the numerical data.