Diluted Magnetic Semiconductors InFeSb Prepared by Laser Ablation: Spectroscopic and Microscopic Investigations

Abstract

We report optical and magneto-optical results as well as atomic force microscopy (AFM) and magnetic force microscopy (MFM) results for InFeSb samples prepared by laser ablation. AFM and MFM studies have revealed the presence of magnetic particles on the samples surface, whose sizes depend on the Fe content and substrate temperature. It has found that both optical and magneto-optical spectra are superposition of spectra from the doped InFeSb layers and particles on their surface.