Study of multi-long-pulse thermography using high-power fiber lasers
Gangbo Hu,
Xue Yang,
Xiangyu Wang,
Wei Fang,
Ning Tao
Affiliations
Gangbo Hu
Key Laboratory of Terahertz Optoelectronics, Ministry of Education, and Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
Xue Yang
Key Laboratory of Terahertz Optoelectronics, Ministry of Education, and Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
Xiangyu Wang
Key Laboratory of Terahertz Optoelectronics, Ministry of Education, and Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
Wei Fang
Key Laboratory of Terahertz Optoelectronics, Ministry of Education, and Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
Ning Tao
Key Laboratory of Terahertz Optoelectronics, Ministry of Education, and Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China
Active infrared thermography tests are performed using a high-power continuous fiber laser as the excitation source. Multi-long-pulses (MLPs) are used to detect deep defects in samples with reduced heating. Simulation results are compared to theoretical predictions based on 1D heat conduction equations. Different excitation modes are compared. Thermal images are processed using pulsed phase thermography and principal component thermography (PCT), showing that the combination of MLP thermal excitation and PCT data analysis provides better defect detection capability and reduces the specimen’s surface temperature in comparison to conventional pulsed thermography.
