Automatic Detection of Small Sample Apple Surface Defects Using ASDINet

Abstract

The appearance quality of apples directly affects their price. To realize apple grading automatically, it is necessary to find an effective method for detecting apple surface defects. Aiming at the problem of a low recognition rate in apple surface defect detection under small sample conditions, we designed an apple surface defect detection network (ASDINet) suitable for small sample learning. The self-developed apple sorting system collected RGB images of 50 apple samples for model verification, including non-defective and defective apples (rot, disease, lacerations, and mechanical damage). First, a segmentation network (AU-Net) with a stronger ability to capture small details was designed, and a Dep-conv module that could expand the feature capacity of the receptive field was inserted in its down-sampling path. Among them, the number of convolutional layers in the single-layer convolutional module was positively correlated with the network depth. Next, to achieve real-time segmentation, we replaced the flooding of feature maps with mask output in the 13th layer of the network. Finally, we designed a global decision module (GDM) with global properties, which inserted the global spatial domain attention mechanism (GSAM) and performed fast prediction on abnormal images through the input of masks. In the comparison experiment with state-of-the-art models, our network achieved an AP of 98.8%, and a 97.75% F1-score, which were higher than those of most of the state-of-the-art networks; the detection speed reached 39ms per frame, achieving accuracy-easy deployment and substantial trade-offs that are in line with actual production needs. In the data sensitivity experiment, the ASDINet achieved results that met the production needs under the training of 42 defective pictures. In addition, we also discussed the effect of the ASDINet in actual production, and the test results showed that our proposed network demonstrated excellent performance consistent with the theory in actual production.

Keywords

• artificial intelligence
• apple defect
• deep learning
• defect detection