Measurement of Dielectric Properties of Thin Materials for Radomes Using Waveguide Cavities

Abstract

We present waveguide cavity measurements used to evaluate several thin materials for use in radomes. In addition to the data on the materials, we show how these measurements can be performed with common laboratory equipment and simple calculations. We sought an approach that allowed candidate materials to be readily evaluated to deal with formerly selected materials becoming unavailable or cost-prohibitive. We used lengths of standard waveguide (WR650 and WR137 here) with readily manufactured irises and a vector network analyzer (Keysight N5225B here). To select the iris size and determine the limits of the simplifications in the equations used, we employed a full-wave 3D electromagnetic simulator (CST Microwave Studio). The equations required to calculate the dielectric properties of samples and their contribution to the equivalent system noise temperature from unloaded and loaded resonant frequencies and Q factors are shown. While these formulations can be found elsewhere, we did not find these assembled as conveniently in other studies in the literature. We also show that orienting the sample down the length of the cavity allows for higher-order modes to be fully utilized. We did not find this straightforward adaptation of the common cross-guide orientation in other works. Overall, the results allowed us to recommend three fabrics for use at the frequencies tested (1.7 and 5.6 GHz). The complete process is outlined to assist others in performing these measurements themselves.

Keywords

• radomes
• dielectrics
• thin materials
• permittivity
• loss tangent
• waveguides