Measurement of transient atomic displacements in thin films with picosecond
          and femtometer resolution

M. Kozina; T. Hu; J. S. Wittenberg; E. Szilagyi; M. Trigo; T. A. Miller; C. Uher; A. Damodaran; L. Martin; A. Mehta; J. Corbett; J. Safranek; D. A. Reis; A. M. Lindenberg

doi:10.1063/1.4875347

Structural Dynamics (May 2014)

Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

M. Kozina,
T. Hu,
J. S. Wittenberg,
E. Szilagyi,
M. Trigo,
T. A. Miller,
C. Uher,
A. Damodaran,
L. Martin,
A. Mehta,
J. Corbett,
J. Safranek,
D. A. Reis,
A. M. Lindenberg

Affiliations

M. Kozina: Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
T. Hu: Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA
J. S. Wittenberg: Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
E. Szilagyi: Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
M. Trigo: Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
T. A. Miller: Department of Materials Science and Engineering, Stanford University, Stanford, California 94305, USA
C. Uher: Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA
A. Damodaran: Department of Materials Science and Engineering, University of Illinois Urbana Champaign, Urbana, Illinois 61801, USA
L. Martin: Department of Materials Science and Engineering, University of Illinois Urbana Champaign, Urbana, Illinois 61801, USA
A. Mehta: Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
J. Corbett: Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
J. Safranek: Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
D. A. Reis: Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA
A. M. Lindenberg: Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA

DOI: https://doi.org/10.1063/1.4875347
Journal volume & issue: Vol. 1, no. 3
pp. 034301 – 034301-8

Abstract

Read online

We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO3, Pb(Zr,Ti)O3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.

Published in Structural Dynamics

ISSN: 2329-7778 (Online)
Publisher: AIP Publishing LLC and ACA
Country of publisher: United States
LCC subjects: Science: Chemistry: Crystallography
Website: http://sd.aip.org

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