Tekhnologiya i Konstruirovanie v Elektronnoi Apparature (Dec 2018)

Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

  • Gritcov S. S.,
  • Sorokin G. F.,
  • Shestacova T. V.

DOI
https://doi.org/10.15222/TKEA2018.5-6.03
Journal volume & issue
no. 5-6
pp. 3 – 9

Abstract

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This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.

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