Computational Science and Techniques (Aug 2014)

Maximal frequent sequence based test suite reduction through DU-pairs

  • Narendra Kumar Rao Bangole,
  • RamaMohan Reddy Ambati

DOI
https://doi.org/10.15181/csat.v2i1.396
Journal volume & issue
Vol. 2, no. 1
pp. 276 – 288

Abstract

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The current paper illustrates the importance of clustering the frequent items of code coverage during test suite reduction. A modular Most maximal frequent sequence clustered algorithm has been used along with a Requirement residue based test case reduction process. DU-pairs form the basic code coverage requirement under consideration for test suite reduction. This algorithm farewell when compared with few other algorithms like Harrold Gupta and Soffa (HGS) and Bi-Objective Greedy (BOG) algorithms and Greedy algorithms in covering all the DU-Pairs. The coverage criteria achieved is 100% in many cases, except for few insufficient and incomplete test suites.DOI: http://dx.doi.org/10.15181/csat.v2i1.396