ACS Materials Au (Oct 2024)

Understanding Defect-Mediated Ion Migration in Semiconductors using Atomistic Simulations and Machine Learning

Md Habibur Rahman,
Maitreyo Biswas,
Arun Mannodi-Kanakkithodi

Affiliations

Md Habibur Rahman
Maitreyo Biswas
Arun Mannodi-Kanakkithodi

DOI: https://doi.org/10.1021/acsmaterialsau.4c00095
Journal volume & issue: Vol. 4, no. 6
pp. 557 – 573

Abstract

No abstracts available.

Published in ACS Materials Au

ISSN: 2694-2461 (Online)
Publisher: American Chemical Society
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering: Materials of engineering and construction. Mechanics of materials
Website: https://pubs.acs.org/journal/amacgu

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