Electronic Proceedings in Theoretical Computer Science (Jul 2017)
Logical Characterization of Trace Metrics
Abstract
In this paper we continue our research line on logical characterizations of behavioral metrics obtained from the definition of a metric over the set of logical properties of interest. This time we provide a characterization of both strong and weak trace metric on nondeterministic probabilistic processes, based on a minimal boolean logic L which we prove to be powerful enough to characterize strong and weak probabilistic trace equivalence. Moreover, we also prove that our characterization approach can be restated in terms of a more classic probabilistic L-model checking problem.