Nature Communications (Apr 2022)

Topological phase singularities in atomically thin high-refractive-index materials

  • Georgy Ermolaev,
  • Kirill Voronin,
  • Denis G. Baranov,
  • Vasyl Kravets,
  • Gleb Tselikov,
  • Yury Stebunov,
  • Dmitry Yakubovsky,
  • Sergey Novikov,
  • Andrey Vyshnevyy,
  • Arslan Mazitov,
  • Ivan Kruglov,
  • Sergey Zhukov,
  • Roman Romanov,
  • Andrey M. Markeev,
  • Aleksey Arsenin,
  • Kostya S. Novoselov,
  • Alexander N. Grigorenko,
  • Valentyn Volkov

DOI
https://doi.org/10.1038/s41467-022-29716-4
Journal volume & issue
Vol. 13, no. 1
pp. 1 – 9

Abstract

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The authors combine films of two-dimensional semiconductors, which exhibit excitonic spectral features, with SiO2/Si Fabry-Perot resonators in order to realize topological phase singularities in reflection. Around these singularities, the reflection spectra demonstrate rapid phase changes while the structure behaves as a perfect absorber.