Radiation (Sep 2021)

Study of CMOS Sensing System for Radon and Alpha Radiation

  • Roy Shor,
  • Yael Nemirovsky

DOI
https://doi.org/10.3390/radiation1030021
Journal volume & issue
Vol. 1, no. 3
pp. 250 – 260

Abstract

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This study focuses on a CMOS sensing system for Radon and alpha radiation, which is based on a semiconductor device that is integrated monolithically on a single chip with the Readout Circuitry, thus allowing fabrication of a low-power and low-cost sensing system. The new sensor is based on a new mosaic design of an array of Floating Gate non-volatile memory-like transistors, which are implemented in a standard CMOS technology, with a single polysilicon layer. The transistors are electrically combined in parallel and are operated at subthreshold, thus achieving very high sensitivity and reduced noise. The sensing system’s architecture and design is presented, along with key operation concepts, characterization, and analysis results. Alpha and radon exposure results are compared to commercial radon detectors. The new sensor, dubbed TODOS-Radon sensor, measures continuously, is battery operated and insensitive to humidity.

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