Total retardance measurements based on the complex Fourier coefficients for the rotating polarizer analyzer system
Geliztle A. Parra-Escamilla,
Joel Cervantes-L,
Jorge L. Flores,
David I. Serrano-García
Affiliations
Geliztle A. Parra-Escamilla
Electro-Photonics Department, University Center of Exact Sciences and Engineering (CUCEI), University of Guadalajara, Av. Revolución No. 1500, CP. 44430 Guadalajara, Jalisco, Mexico; Faculty of Engineering, Universidad Panamericana, Álvaro del Portillo 49, Zapopan, Jalisco, 45010, Mexico
Joel Cervantes-L
Electro-Photonics Department, University Center of Exact Sciences and Engineering (CUCEI), University of Guadalajara, Av. Revolución No. 1500, CP. 44430 Guadalajara, Jalisco, Mexico; Corresponding author.
Jorge L. Flores
Electro-Photonics Department, University Center of Exact Sciences and Engineering (CUCEI), University of Guadalajara, Av. Revolución No. 1500, CP. 44430 Guadalajara, Jalisco, Mexico
David I. Serrano-García
Electro-Photonics Department, University Center of Exact Sciences and Engineering (CUCEI), University of Guadalajara, Av. Revolución No. 1500, CP. 44430 Guadalajara, Jalisco, Mexico
We propose a demodulation algorithm based on the calculus of the complex Fourier coefficients; we used a dual rotating polarizer-analyzer polarimeter to show the feasibility of our proposal. Our demodulation algorithm considers the frequency response obtained by the system, and its possible to calculate the total retardation, fast axis orientation and ellipticity of a sample. Our proposal does not require recovering the full Mueller matrix from getting those parameters. In addition, as the proposal does not use retarders for the measurement, the system presents potential applications for multi-wavelength measurements on phase retardation samples. We show experimental results showing the capabilities of our proposal in characterizing a polarization retardance sample.
