Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2
Yue Niu,
Sergio Gonzalez-Abad,
Riccardo Frisenda,
Philipp Marauhn,
Matthias Drüppel,
Patricia Gant,
Robert Schmidt,
Najme S. Taghavi,
David Barcons,
Aday J. Molina-Mendoza,
Steffen Michaelis de Vasconcellos,
Rudolf Bratschitsch,
David Perez De Lara,
Michael Rohlfing,
Andres Castellanos-Gomez
Affiliations
Yue Niu
National Center for International Research on Green Optoelectronics & Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou 510006, China
Sergio Gonzalez-Abad
Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, E-28049 Madrid, Spain
Riccardo Frisenda
Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
Philipp Marauhn
Institute of Solid-state Theory, University of Münster, 48149 Münster, Germany
Matthias Drüppel
Institute of Solid-state Theory, University of Münster, 48149 Münster, Germany
Patricia Gant
Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
Robert Schmidt
Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Najme S. Taghavi
Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
David Barcons
Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, E-28049 Madrid, Spain
Aday J. Molina-Mendoza
Institute of Photonics, Vienna University of Technology, Gusshausstrasse 27–29, 1040 Vienna, Austria
Steffen Michaelis de Vasconcellos
Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
Rudolf Bratschitsch
Institute of Physics and Center for Nanotechnology, University of Münster, 48149 Münster, Germany
David Perez De Lara
Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, E-28049 Madrid, Spain
Michael Rohlfing
Institute of Solid-state Theory, University of Münster, 48149 Münster, Germany
Andres Castellanos-Gomez
Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, 28049 Madrid, Spain
The research field of two dimensional (2D) materials strongly relies on optical microscopy characterization tools to identify atomically thin materials and to determine their number of layers. Moreover, optical microscopy-based techniques opened the door to study the optical properties of these nanomaterials. We presented a comprehensive study of the differential reflectance spectra of 2D semiconducting transition metal dichalcogenides (TMDCs), MoS2, MoSe2, WS2, and WSe2, with thickness ranging from one layer up to six layers. We analyzed the thickness-dependent energy of the different excitonic features, indicating the change in the band structure of the different TMDC materials with the number of layers. Our work provided a route to employ differential reflectance spectroscopy for determining the number of layers of MoS2, MoSe2, WS2, and WSe2.
