Comparison of Interpolators Used for Time-Interval Measurement Systems Based on Multiple-Tapped Delay Line

Abstract

The paper describes the construction, operation and test results of three most popular interpolators from a viewpoint of time-interval (TI) measurement systems consisting of many tapped-delay lines (TDLs) and registering pulses of a wide-range changeable intensity. The comparison criteria include the maximum intensity of registered time stamps (TSs), the dependency of interpolator characteristic on the registered TSs’ intensity, the need of using either two counters or a mutually-complementing pair counter-register for extending a measurement range, the need of calculating offsets between TDL inputs and the dependency of a resolution increase on the number of used TDL segments. This work also contains conclusions about a range of applications, usefulness and methods of employing each described TI interpolator. The presented experimental results bring new facts that can be used by the designers who implement precise time delays in the field-programmable gate arrays (FPGA).

Keywords

• time interval
• multiple-tapped delay line
• quantization-and-nonlinearity minimization
• FPGA
• time-todigital converter