AFM (Atomic force microscope) and its use in studying the surface

Abstract

The paper summarizes the present knowledge about the use of AFM in the mineral processing research. First, the development and fundamentals of the AFM imaging are presented in relation to other imaging techniques (especially STM, Scanning tunneling microscope). Further, the role of the sensing tip-surface interactions is mentioned. Finally, the surface force measurements in the AFM force calibration mode are diskussed.

Keywords

• Atomic force microscope (AFM)
• surface
• imaging
• surface forces
• minerals
• mineral processing