Nanotechnology and Precision Engineering (Dec 2019)

Electron paramagnetic resonance characterization of aluminum ion implantation-induced defects in 4H-SiC

  • Xiuhong Wang,
  • Zongwei Xu,
  • Mathias Rommel,
  • Bing Dong,
  • Le Song,
  • Clarence Augustine TH Tee,
  • Fengzhou Fang

Journal volume & issue
Vol. 2, no. 4
pp. 157 – 162

Abstract

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Deep-level defects in silicon carbide (SiC) are critical to the control of the performance of SiC electron devices. In this paper, deep-level defects in aluminum ion-implanted 4H-SiC after high-temperature annealing were studied using electron paramagnetic resonance (EPR) spectroscopy at temperatures of 77 K and 123 K under different illumination conditions. Results showed that the main defect in aluminum ion-implanted 4H-SiC was the positively charged carbon vacancy (VC+), and the higher the doping concentration was, the higher was the concentration of VC+. It was found that the type of material defect was independent of the doping concentration, although more VC+ defects were detected during photoexcitation and at lower temperatures. These results should be helpful in the fundamental research of p-type 4H-SiC fabrication in accordance with functional device development. Keywords: Electron paramagnetic resonance, Silicon carbide, Defects, Carbon vacancy