Deuterium concentration depth profiling in sputter-deposited tungsten coated F82H using secondary ion mass spectrometry

Y. Xu; Y. Hirooka; L.M. Luo; Y.C. Wu

Nuclear Materials and Energy (Dec 2019)

Deuterium concentration depth profiling in sputter-deposited tungsten coated F82H using secondary ion mass spectrometry

Y. Xu,
Y. Hirooka,
L.M. Luo,
Y.C. Wu

Affiliations

Y. Xu: School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China; Corresponding author.
Y. Hirooka: College of Engineering, Chubu University, 1200 Matsumoto, Kasugai, Aichi 487-8501, Japan
L.M. Luo: School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China; National-Local Joint Engineering Research Centre of Nonferrous Metals and Processing Technology, Hefei 230009, China
Y.C. Wu: School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China; National-Local Joint Engineering Research Centre of Nonferrous Metals and Processing Technology, Hefei 230009, China; Base of Introducing Talents Discipline to Universities for Advanced Clean Energy, Hefei 230009, China; Corresponding author at: School of Materials Science and Engineering, Hefei University of Technology, Hefei 230009, China.

Journal volume & issue: Vol. 21

Abstract

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Deuterium plasma-driven permeation (PDP) through reduced activation ferritic steel alloy F82H with and without sputter-deposited tungsten (SP-W) coatings has been conducted using a laboratory-scale steady-state plasma facility. SP-W coatings have been found to enhance PDP flux with a much slow breakthrough to reach steady-state. Static deuterium retention has been evaluated with thermal desorption spectroscopy. Enhanced deuterium retention in SP-W coated F82H has been observed, compared with that in bare F82H. Secondary ion mass spectrometry (SIMS) has been carried out to obtain the depth profile of deuterium concentration crossing the W/F82H interface. SIMS data indicate the deuterium concentration is much higher in W coatings than that in F82H substrate, exhibiting an “uphill diffusion” profile. Keywords: Plasma-driven permeation, SIMS, Tungsten coatings, F82H, Deuterium retention

Published in Nuclear Materials and Energy

ISSN: 2352-1791 (Online)
Publisher: Elsevier
Country of publisher: United Kingdom
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering: Nuclear engineering. Atomic power
Website: http://www.journals.elsevier.com/nuclear-materials-and-energy/

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