In this paper, the near-field radiated susceptibility pre-mapping method is proposed using the improved near-field probe power radiation profile assessment. The modelling of the electromagnetic field strength in 80–3000 MHz range in the proximity of the near-field probe was performed. The −6 dB aperture boundaries of the near-field probe and their variation, due to the proximity of the radio frequency (RF) printed circuit board (PCB) components, were determined, while the aperture map distortion, arising from the proximity of the passive RF PCB components were evaluated. The scanning path requirements for the RF susceptibility mapping were determined. The simulation of improved near-field probe absolute magnetic field strength reference map in open-air conditions is carried out in this work. The comparative analysis using the absolute maximum difference metric of orthogonal absolute magnetic field map cross-sections between the reference map and magnetic field maps affected by the proximity of the components was carried out. The experimental study of the RF amplifier stage susceptibility map with susceptibility mapping measurement results are presented in this work.
