Engineering Proceedings (Nov 2022)

On-Chip Tests for the Characterization of the Mechanical Strength of Polysilicon

  • Tiago Vicentini Ferreira do Valle,
  • Aldo Ghisi,
  • Stefano Mariani,
  • Gabriele Gattere,
  • Francesco Rizzini,
  • Luca Guerinoni,
  • Luca Falorni

DOI
https://doi.org/10.3390/ecsa-9-13363
Journal volume & issue
Vol. 27, no. 1
p. 10

Abstract

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Microelectromechanical systems (MEMS) are nowadays widespread in the sensor market, with several different applications. New production techniques and ever smaller device geometries require a continuous investigation of potential failure mechanisms in such devices. This work presents an experimental on-chip setup to assess the geometry- and material-dependent strength of stoppers adopted to limit the deformation of movable parts, using an electrostatically actuated device. A series of comb-finger and parallel plate capacitors are used to provide a rather large stroke to a shuttle, connected to the anchors through flexible springs. Upon application of a varying voltage, failure of stoppers of variable size is observed and confirmed by post-mortem ΔC–V curves. The results of the experimental campaign are collected to infer the stochastic property of the strength of polycrystalline, columnar silicon films.

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