Fluctuation Analysis of Instantaneous Availability for the Parallel Repairable Systems

Yi Yang; Qianbin Li; Xuefeng Chen; Rui Kang

doi:10.1109/ACCESS.2019.2909755

IEEE Access (Jan 2019)

Fluctuation Analysis of Instantaneous Availability for the Parallel Repairable Systems

Yi Yang,
Qianbin Li,
Xuefeng Chen,
Rui Kang

Affiliations

Yi Yang: School of Reliability and Systems Engineering, Beihang University, Beijing, China
Qianbin Li: School of Science, Nanjing University of Science and Technology, Nanjing, China
Xuefeng Chen: School of Science, Nanjing University of Science and Technology, Nanjing, China
Rui Kang: School of Reliability and Systems Engineering, Beihang University, Beijing, China

DOI: https://doi.org/10.1109/ACCESS.2019.2909755
Journal volume & issue: Vol. 7
pp. 53358 – 53364

Abstract

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This paper is aimed to study the fluctuation of the instantaneous availability (IA) for the parallel repairable system. First, the Markov model of IA for the two-unit parallel system with two states (up and down) under exponential distribution is established. Next, by Laplace transformation, the analytical solution of IA is obtained. The fluctuation of IA is analyzed according to the fluctuation theories. Then, in the same way, the fluctuation of IA for the n-unit parallel system with two states is analyzed, where the n units of the system are all same. Finally, some numerical examples are provided to show the effectiveness of the results in this paper.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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