The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences (Sep 2019)

SCAN-TO-BIM METHODOLOGY ADAPTED FOR DIFFERENT APPLICATION

  • V. Badenko,
  • A. Fedotov,
  • D. Zotov,
  • S. Lytkin,
  • D. Volgin,
  • R. D. Garg,
  • M. Liu

DOI
https://doi.org/10.5194/isprs-archives-XLII-5-W2-1-2019
Journal volume & issue
Vol. XLII-5-W2
pp. 1 – 7

Abstract

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In this paper we proposed a methodology that describes the major steps of a scan-to-BIM process. The methodology includes six steps: (1) classification of considered elements, (2) definition of required level of detail (GI), (3) scan data acquisition, (4) point cloud registration and segmentation, (5) as-built BIM creation and (6) analysis. The examples of the application of the proposed methodology are demonstrated by creation of as-built BIM models for existing industrial sites and historic buildings. As the results of these case studies have shown, the proposed methodology can be used for as-built BIMs without any prior information.