Redirecting Incident Light with Mie Resonance-Based Coatings

Abstract

The efficiency of thin film photoelectric devices can be improved by redirecting incident electromagnetic radiation along their surface layers. Redirection can be achieved using antireflection coatings made of subwavelength dielectric particle arrays. In this study, we fabricate such coatings, consisting of Ge particles on quartz glass substrates via solid-state dewetting, transforming thin Ge films into compact particles. Using optically transparent substrates, we measure reflection and transmission spectra and determine absorption spectra, showing that substrates coated with Ge particles absorb much more strongly than substrates coated with continuous Ge films. The spectra obtained using objective lenses with different aperture angles indicate that scattered radiation is predominantly directed at glancing angles to the substrate surface. The lateral propagation of scattered radiation is the result of destructive interference, which suppresses both reflected and transmitted radiation.

Keywords

• antireflection coatings
• scattered light propagation
• Mie resonances
• solid-state dewetting
• Ge on silica glass