Structural and Magnetoresistance Properties of Transfer-Free Amorphous Carbon Thin Films
Awais Siddique Saleemi,
Ali Abdullah,
Muhammad Saeed,
M. Anis-ur-Rehman,
Ayyaz Mahmood,
Karim Khan,
Maryam Kiani,
Shern-long Lee
Affiliations
Awais Siddique Saleemi
Institute for Advanced Study, Shenzhen University, Shenzhen 518060, Guangdong, China
Ali Abdullah
School of Science, University of Management and Technology, Sialkot 51310, Pakistan
Muhammad Saeed
Institute for Advanced Study, Shenzhen University, Shenzhen 518060, Guangdong, China
M. Anis-ur-Rehman
Applied Thermal Physics Laboratory, Department of Physics, COMSATS University, Islamabad 44000, Pakistan
Ayyaz Mahmood
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Provence, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, Guangdong, China
Karim Khan
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Provence, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, Guangdong, China
Maryam Kiani
Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Provence, College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, Guangdong, China
Shern-long Lee
Institute for Advanced Study, Shenzhen University, Shenzhen 518060, Guangdong, China
The control of the morphologies and thus the optical, electrical, and magnetic effect of 2D thin films is a challenging task for the development of cost-efficient devices. In particular, the angular dependent magnetoresistance (MR) of surface thin films up to room temperature is an interesting phenomenon in materials science. Here, we report amorphous carbon thin films fabricated through chemical vapor deposition at a SiO2 substrate. Their structural and angular magnetoresistance properties were investigated by several analytical tools. Specifically, we used a physical property measurement system to estimate the magnitude of the angular MR of these as-prepared sample thin films from 2 K to 300 K. An angular MR magnitude of 1.6% for the undoped a-carbon thin films was found up to 300 K. Under the magnetic field of 7 T, these films possessed an angular MR of 15% at a low temperature of 2 K. A high disorder degree leads to a large magnitude of MR. The grain boundary scattering model was used to interpret the mechanism of this angular MR.
