IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing (Jan 2020)

Foreword for the Special Issue on Advances in Pattern Recognition in Remote Sensing

Jie Shan,
Eckart Michaelsen,
Uwe Stilla,
Fenzhen Su

Affiliations

Jie Shan: ORCiD; Purdue University, West Lafayette, IN, USA
Eckart Michaelsen: ORCiD; Fraunhofer-IOSB, Karlsruhe, Germany
Uwe Stilla: ORCiD; Technical University of Munich, München, Germany
Fenzhen Su: Institute of Geographic Sciences & Natural Resources Research, Beijing, China

DOI: https://doi.org/10.1109/JSTARS.2020.3028483
Journal volume & issue: Vol. 13
pp. 6164 – 6165

Abstract

The papers in this special section covers various topics in pattern recognition that deploy remote sensing applications.

Published in IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing

ISSN: 1939-1404 (Print); 2151-1535 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Ocean engineering; Science: Physics: Geophysics. Cosmic physics
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4609443

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